FEI, a leading provider of atomic-scale imaging and analysis systems, has released the Quanta^TM 50 Series scanning electron microscope (SEM), which offers a combination of performance and versatility over a wide range of samples. “The new Quanta 50 Series is one of the most versatile SEMs currently available,” said Daniel Phifer, Product Marketing Manager, FEI. “It is designed as a multipurpose SEM for labs that require high-performance imaging for a broad range of samples, including those that are insulating, wet, dirty, or dynamically changing, in industries such as materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals and biology. Unlike other SEMs, where the sample has to fit the instrument design, the unique Quanta 50 Series is designed to enable viewing of any sample in its natural state. [It] delivers powerful performance and flexibility, which enables it to remain a valuable investment as the needs of the lab change over time,” Phifer added.

FEI has adapted some technologies used in the Magellan^TM Extreme High Resolution SEM to engineer dramatic improvements in the new Quanta system. Specifically, beam deceleration increases the surface imaging capability with lower landing energies, and SmartSCAN^TM technologies further improve image quality by reducing noise. This adds high-vacuum, low-landing energy imaging capability to Quanta’s low-vacuum and environmental SEM (ESEM) technology, with ESEM enabling a broad range of in situ imaging conditions. The Quanta 50 Series will be available in April 2009, and includes tungsten and high-performance field emission electron source options.