SPECTRO Analytical Instruments has announced its new line of SPECTRO XEPOS spectrometers, representing, the company states, “a quantum leap in energy dispersive X-ray fluorescence (ED-XRF) technology and providing breakthrough advances in the multi-elemental analysis of major, minor, and trace element concentrations.
“New developments in excitation and detection introduced with the new SPECTRO XEPOS ED-XRF spectrometers deliver outstanding sensitivity and detection limits and yield remarkable gains in precision and accuracy. The analysers excel at demanding applications in geological science – and more.
Features include spectacular sensitivity. Innovations in adaptive excitation plus tube and detector technologies that dramatically improve sensitivity — often by ten times or more — boost precision, realise significantly lower detection levels, and deliver a fast and accurate analysis of a wide range of elements, from sodium to uranium. Enhanced with new high-count detector and tube designs, new sensitivity, and minimised backgrounds, the new analysers’ proprietary adaptive excitation technology enables exceptionally low limits of detection (LODs) for a wide range of elements.
Unlike most ED-XRF elemental analysers, the X-ray tubes in SPECTRO XEPOS spectrometers remain powered on between measurements to prevent on/off variations from affecting readings. This ensures long-term stability, realises an exceptionally high degree of precision in elemental analysis — up to three times better than before, and delivers substantially improved analytical accuracy for concentrations from trace elements to major components.
For operators who require speed more than utmost precision, SPECTRO XEPOS units can dramatically cut measurement times, while still maintaining precision levels comparable to traditional ED-XRF spectrometers. The system’s high speed helps to achieve analyses of most samples within a few minutes.
Redesigned operating software provides proven ease and power, while the unique new TurboQuant II software quickly and accurately analyses practically any unknown liquid, powder, or solid sample. In addition, the new SPECTRO XEPOS spectrometers exhibit a significantly lower cost of ownership than wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers — thus delivering WD performance at an ED price for many applications.
Optional AMECARE M2M (machine-to-machine) support extends the new analysers’ self-diagnostic functions with proactive alerts, backed up by direct connection with a remote SPECTRO service expert’s PC.
The new line of SPECTRO XEPOS ED-XRF spectrometers is available immediately from SPECTRO Analytical Instruments. Four advanced versions are available, enabling users to prioritise their selection according to measurement speed, ultimate precision, or groups of targeted elements in specific matrices.
