Tag Archives: SPECTRA.ELEMENTS

Bruker brings benchtop EDXRF into lab automation space

Among several new innovations Bruker has launched is a benchtop X-ray elemental analyser that, the company says, can speed up elemental analysis in mining applications and be integrated into automated laboratory environments.

Originally planned for a launch at the now delayed Analytica 2020, this week, Bruker has proceeded with an online launch of these new products.

The company says its next-generation benchtop energy dispersive X-ray Fluorescence (EDXRF) spectrometer, S2 PUMA™ Series 2, is equipped with HighSense™ technology for increases in throughput by about a factor of three times.

Bruker’s software, SPECTRA.ELEMENTS™, comes with enhanced features and faster algorithms, leading to circa-40% shorter evaluation times, the company said.

The S2 PUMA Series 2 supports elemental analysis applications from cement, steel, mining and petrochemical, to food analysis and pharma quality control, according to the company.

The benchtop EDXRF instrument is used for solid and liquid samples, prepared or bulk, for the elemental analysis from carbon to americium (C – Am), according to Bruker. “Detectable elemental concentrations in the samples can range from parts per million up to 100%,” it said.

Bruker continued: “The HighSense technology of the S2 PUMA Series 2 combines high-power (50 W), long-life-time X-ray tube with closely coupled optics and the HighSense detectors. The HighSense (for Na to Am) and HighSense LE detector (C-Am) are next generation silicon drift detectors with high count rates, superb energy resolution, and Peltier-cooling for shortest measurement times, excellent data quality and low operation costs

“The unique sample handling options of the S2 PUMA Series 2 make it the perfect fit for many applications in industry and research, where precise and accurate results must be delivered fast on an easy-to-operate instrument.”

Depending on sample type and desired throughput, the versions Single, XY Autochanger, Carousel, Automation, and Mapping-Stage are available, the company said.

And, according to Bruker, the S2 PUMA Series 2 Automation is the only benchtop EDXRF spectrometer ready for full integration into automated laboratory environments.

“The Mapping-Stage enables automated multi-spot analysis collected on small and large samples (up to 152 mm in diameter),” Bruker said.